<< Go Back

Inspection/Metrology

Micro measurement system

• Critical Dimension microscope for device/trace measurement within 0.0001” accuracy for X, Y, Z measurement
• Includes 50X, 100X, and 500X objectives

Scanning Acoustic Microscope (SAM)

• Sonix Model UHR2000
• Non Destructive Micro Electronics inspection (delaminations, cracks and other anomalies)using
• Ultra High Frequency Pulse Echo Transmission. Available traducers include 15mHz, 75mHz, and 110mHz

Nikon Stereoscopic Microscope

• Variable low magnification for micromanipulation of the sample as required in a large and comfortable working space. The wide field of view and variable magnification displayed by stereomicroscopes is also useful for construction of miniature assemblies